Amazon cover image

Image from Amazon.com

Normal view MARC view ISBD view

Mathematical models for systems reliability Benjamin Epstein

By:

Epstein Benjamin

Contributor(s):

Ishay Weeissman

Publication details: CRC Press 2008Description: 253pISBN:

9781420080827

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings ( 1 )
Comments ( 0 )

Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Books	IIITDM Kancheepuram Library Reference	658.562:519.28 EPS (Browse shelf(Opens below))	Available	MAT		0001880

Total holds: 0

There are no comments on this title.

to post a comment.

Previous

Back to results

Next

1
2
3
4
5
6

1 Quantitative Aptitude
by Aggarwal R.S.
2 A modern approach to logical reasoning
by Aggarwal R.S
3 A modern approach to verbal & non-verbal reasoning
by Aggarwal R.S
4 Arithmetic for competitive examinations
by Aggarwal R.S
5 Quantitative aptitude for competitive examinations
by Aggarwal R S
6 A modern approach to logical reasoning
by Aggarwal R.S.

Close

Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com)

Share

OPAC Designed and Maintained by IIITDM Library Team.
Copyright © IIITDM Kancheepuram Library