000 00338 a2200121 4500
020 _a9781891121890
082 _a621.396.029:621.382.3 GAO
245 _aRF and microwave modeling and measurement techniques for field effect transistors
260 _bScitech Publishing
_c2010
300 _ax, 339 p
942 _cREF
100 _aGao, Jianjun
999 _c1702
_d1702